ESD–RF co-design methodology for the state of the art RF-CMOS blocks

✍ Scribed by V. Vassilev; S. Thijs; P.L. Segura; P. Wambacq; P. Leroux; G. Groeseneken; M.I. Natarajan; H.E. Maes; M. Steyaert

• Publisher: Elsevier Science
• Year: 2005
• Tongue: English
• Weight: 548 KB
• Volume: 45
• Category: Article
• ISSN: 0026-2714
• DOI: 10.1016/j.microrel.2004.05.013