๐”– Bobbio Scriptorium
โœฆ   LIBER   โœฆ

Errors of the electromagnetic current gauge due the vessel's drift caused by the wind

โœ Scribed by V.V. Novysh

Book ID
113140060
Publisher
Elsevier Science
Year
1962
Weight
698 KB
Volume
9
Category
Article
ISSN
0011-7471

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โœ Mao, Ling-Feng ๐Ÿ“‚ Article ๐Ÿ“… 2007 ๐Ÿ› John Wiley and Sons ๐ŸŒ English โš– 437 KB

## Abstract The effects of the barrier height reduction caused by the channel electron velocity due to the effective electron mass difference between silicon and oxide on the gate leakage current in a MOSFET are discussed The calculations show such a barrier height reduction will have a large effec