✦ LIBER ✦
Error Rate-Based Wear-Leveling for nand Flash Memory at Highly Scaled Technology Nodes
✍ Scribed by Pan, Yangyang; Dong, Guiqiang; Zhang, Tong
- Book ID
- 121310727
- Publisher
- IEEE
- Year
- 2013
- Tongue
- English
- Weight
- 469 KB
- Volume
- 21
- Category
- Article
- ISSN
- 1063-8210
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