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Error minimization method for spectroscopic and phase-modulated ellipsometric measurements on highly transparent thin films

✍ Scribed by Campmany, J.; Bertran, E.; Canillas, A.; Andújar, J. L.; Costa, J.


Book ID
115387103
Publisher
Optical Society of America
Year
1993
Tongue
English
Weight
753 KB
Volume
10
Category
Article
ISSN
1084-7529

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