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Error-driven edge selection for -modulated signals to suppress in-band noise due to non-uniform sampling

✍ Scribed by Lee, Eel-Wan; Chae, Soo-Ik


Book ID
125521935
Publisher
The Institution of Electrical Engineers
Year
1998
Tongue
English
Weight
274 KB
Volume
34
Category
Article
ISSN
0013-5194

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