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Error Classification and Yield Prediction of Chips in Semiconductor Industry Applications

โœ Scribed by L. Ludwig; E. Sapozhnikova; V. Lunin; W. Rosenstiel

Book ID
106175781
Publisher
Springer-Verlag
Year
2000
Tongue
English
Weight
222 KB
Volume
9
Category
Article
ISSN
0941-0643

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## Abstract This paper considers the problem of predicting claim costs in the automobile insurance industry. The first stage involves classifying policy holders according to their perceived risk, followed by modelling the claim costs within each risk group. Two methods are compared for the risk cla