Erratum to: “Secondary-ion mass spectrometry (SIMS) analysis of catalyst coatings used in microreactors” [Nucl. Instr. and Meth. B 219–220 (2004) 880–885]

✍ Scribed by Hubert Gnaser; Wolfgang Bock; Elisabeth Rowlett; Yong Men; Christiane Ziegler; Ralf Zapf; Volker Hessel

• Publisher: Elsevier Science
• Year: 2004
• Tongue: English
• Weight: 339 KB
• Volume: 226
• Category: Article
• ISSN: 0168-583X
• DOI: 10.1016/j.nimb.2004.07.011