Erratum to: Comparative Studies of the Growth and Characterization of Germanium Epitaxial Film on Silicon (001) with 0° and 6° Offcut

✍ Scribed by Kwang Hong Lee,Yew Heng Tan,Adam Jandl…

• Book ID: 126362962
• Publisher: Springer US
• Year: 2013
• Tongue: English
• Weight: 234 KB
• Volume: 42
• Category: Article
• ISSN: 0361-5235
• DOI: 10.1007/s11664-013-2808-4