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Erratum to: “Apertureless near field optical microscopy: a contribution to the understanding of the signal detected in the presence of a background field” [Opt. Commun. 230 (2004) 245]

✍ Scribed by Sylvain Hudlet; Sébastien Aubert; Aurélien Bruyant; Renaud Bachelot; Pierre-Michel Adam; Jean-Louis Bijeon; Gilles Lérondel; Pascal Royer; Andrei A Stashkevich

Publisher: Elsevier Science
Year: 2004
Tongue: English
Weight: 127 KB
Volume: 236
Category: Article
ISSN: 0030-4018
DOI: 10.1016/j.optcom.2004.03.065

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Apertureless near field optical microsco

Apertureless near field optical microscopy: a contribution to the understanding of the signal detected in the presence of a background field

✍ Sylvain Hudlet; Sébastien Aubert; Aurélien Bruyant; Renaud Bachelot; Pierre-Mich 📂 Article 📅 2004 🏛 Elsevier Science 🌐 English ⚖ 201 KB

Apertureless scanning near field optical microscopy techniques have become a common way of studying surface samples. By using a nano-probe that scatters the electromagnetic non-propagative waves emerging from a given sample, this microscopy provides optical images with a resolution beyond the diffra