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Erbium ion luminescence of silicon nanocrystal layers in a silicon dioxide matrix measured under strong optical excitation

✍ Scribed by V. Yu. Timoshenko; O. A. Shalygina; M. G. Lisachenko; D. M. Zhigunov; S. A. Teterukov; P. K. Kashkarov; D. Kovalev; M. Zacharias; K. Imakita; M. Fujii

Book ID: 110140964
Publisher: SP MAIK Nauka/Interperiodica
Year: 2005
Tongue: English
Weight: 72 KB
Volume: 47
Category: Article
ISSN: 1063-7834
DOI: 10.1134/1.1853460

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