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Equivalent refractive index of multilayer films of different materials

✍ Scribed by K.L. Chopra; Shiv K. Sharma; V.N. Yadava

Publisher: Elsevier Science
Year: 1974
Tongue: English
Weight: 480 KB
Volume: 20
Category: Article
ISSN: 0040-6090
DOI: 10.1016/0040-6090(74)90056-x

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## Abstract A method is presented whereby the refractive‐index profile (RIP) can be reconstructed from sets of effective indexes measured with different mode types and external refractive indexes. Single‐mode waveguide RIP characterization can be easily realized using an index‐matching liquid at a