Equivalent network characterization for dielectric materials
โ Scribed by H. S. B. Elayyan; S. N. Al-Refaie
- Publisher
- Springer
- Year
- 1996
- Tongue
- English
- Weight
- 412 KB
- Volume
- 31
- Category
- Article
- ISSN
- 0022-2461
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๐ SIMILAR VOLUMES
An equivalent circuit for dielectrics exhibiting frequency dispersion has been obtained using a new multiple-arc analysis in conjunction with relaxation time distribution (RTD). Subsequently, an equivalent network was derived for a zinc oxide (ZnO)-based ceramic varistor at low electric fields. Repo
## Abstract Artificial neural networks (ANNs) are proposed as an inversion approach in microwave measurement methods of the dielectric characteristics of materials. Reflection and transmission methods require a proper electromagnetic (EM) model of the measurement system, and solutions in terms of t
A comparison with the case of a dielectric nondispersive w x cluster 8 when the shift of the value of the plasma cluster velocity corresponding to the maximum reflectivity of the electromagnetic wave in the waveguide โค is lacking shows 1 that the shift of the reflectivity maximum to smaller values o