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Equivalent doping profile transformation: a semi-empirical, analytical method for predicting breakdown characteristics of an approximate single-diffused parallel-plane junction

✍ Scribed by Jin He; Xing Zhang; Yangyuan Wang


Book ID
114538959
Publisher
IEEE
Year
2001
Tongue
English
Weight
108 KB
Volume
48
Category
Article
ISSN
0018-9383

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