✦ LIBER ✦
Equivalent Circuit Model for the Gate Leakage Current in Broken Down $\hbox{HfO}_{2}/\hbox{TaN/TiN}$ Gate Stacks
✍ Scribed by Miranda, Enrique; Pey, Kin-Leong; Ranjan, Rakesh; Tung, Chih-Hang
- Book ID
- 125847106
- Publisher
- IEEE
- Year
- 2008
- Tongue
- English
- Weight
- 140 KB
- Volume
- 29
- Category
- Article
- ISSN
- 0741-3106
No coin nor oath required. For personal study only.