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Equipment for long-term creep testing at cryogenic temperatures

โœ Scribed by C.T. Yen; L.D. Roth; J.M. Wells; J.K. Tien


Publisher
Elsevier Science
Year
1984
Tongue
English
Weight
545 KB
Volume
24
Category
Article
ISSN
0011-2275

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โœฆ Synopsis


Equipment and procedures for long-term cryogenic creep testing are presented in detail. Particular attention was given to the maintaining of constant cryogenic test temperature and with respect to the stability and sensitivity of strain measurements. Typical long-term cryogenic creep testing results on oxygen free high conductivity (OFHC) copper are presented.


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