Equipment for long-term creep testing at cryogenic temperatures
โ Scribed by C.T. Yen; L.D. Roth; J.M. Wells; J.K. Tien
- Publisher
- Elsevier Science
- Year
- 1984
- Tongue
- English
- Weight
- 545 KB
- Volume
- 24
- Category
- Article
- ISSN
- 0011-2275
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โฆ Synopsis
Equipment and procedures for long-term cryogenic creep testing are presented in detail. Particular attention was given to the maintaining of constant cryogenic test temperature and with respect to the stability and sensitivity of strain measurements. Typical long-term cryogenic creep testing results on oxygen free high conductivity (OFHC) copper are presented.
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