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Equations of elect roelasticity of isotropic dielectrics in electrostatic fields

✍ Scribed by Ya. I. Burak

Publisher
Springer
Year
1967
Tongue
English
Weight
300 KB
Volume
2
Category
Article
ISSN
1573-885X

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## Abstract This work investigates the capability of spectroscopic ellipsometry to measure charge trapping centers in thin dielectric films. Specific interfacial electrostatic fields, induced by electrons injected into charge trapping states at the interface, have been identified that directly affe