EPROM Testing—Part II: Application to 16K N-channel devices: S. Alliney, D. Bertotti, F. Fantini and C. Morandi. Microelectron. Reliab.22 (5), 987 (1982)

• Publisher: Elsevier Science
• Year: 1983
• Tongue: English
• Weight: 129 KB
• Volume: 23
• Category: Article
• ISSN: 0026-2714
• DOI: 10.1016/0026-2714(83)90839-9