EPR evidence for compensating defects in BaTiO3 grain boundary barrier layer capacitors

✍ Scribed by Chiou Bi-Shiou; Lin Sin-Tah; Jenq-Gong Duh

• Book ID: 113299860
• Publisher: Elsevier Science
• Year: 1990
• Tongue: English
• Weight: 325 KB
• Volume: 24
• Category: Article
• ISSN: 0254-0584
• DOI: 10.1016/0254-0584(90)90088-r