Structural characterization of epitaxial
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E. GarcΓa-GonzΓ‘lez; G. Wagner; M. Reedyk; H.U. Habermeier
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Article
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1994
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Elsevier Science
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English
β 163 KB
The microstructural differences of YBCO thin films prepared by RF sputtering at the optimal deposition conditions for c-axis epitaxy on (100)-SrTiO3 and (100)-LaAIO3 have been investigated.