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Epitaxial and thermal strains in oxidic thin films on Si(001)

✍ Scribed by Th. Matthée; J. Wecker; A. Bardal; K. Samwer

Book ID: 107864407
Publisher: Elsevier Science
Year: 1995
Tongue: English
Weight: 386 KB
Volume: 258
Category: Article
ISSN: 0040-6090
DOI: 10.1016/0040-6090(94)06396-6

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