The improved electromechanical sensitivi
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Pandiyan Murugaraj; David Mainwaring; Nurra Ali Khelil; Ju Lin Peng; Rainer Sieg
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Article
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2010
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Elsevier Science
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English
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Greatly enhanced electromechanical sensitivities were observed in ion beam irradiated polyimide films, where high resolution transmission electron microscopy and atomic force microscopy studies showed that 5.5 MeV Cu 3+ ions produce randomly dispersed and highly oriented conducting nanochannels cont