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Enhancement of the Electrical Safe Operating Area of Integrated DMOS Transistors With Respect to High-Energy Short Duration Pulses

✍ Scribed by Podgaynaya, A.; Pogany, D.; Gornik, E.; Stecher, M.


Book ID
114620186
Publisher
IEEE
Year
2010
Tongue
English
Weight
830 KB
Volume
57
Category
Article
ISSN
0018-9383

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