✦ LIBER ✦
Enhancement of IR emission from a dislocation network in Si due to an external bias voltage
✍ Scribed by X. Yu; O.F. Vyvenko; M. Reiche; M. Kittler
- Publisher
- Elsevier Science
- Year
- 2007
- Tongue
- English
- Weight
- 485 KB
- Volume
- 27
- Category
- Article
- ISSN
- 0928-4931
No coin nor oath required. For personal study only.