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Enhancement of accuracy for measuring the susceptibility of integrated circuits to conducted electromagnetic disturbances

✍ Scribed by Chahine, I.; Kadi, M.; Gaboriaud, E.; Gallenne, X.; Louis, A.; Mazari, B.

Book ID
114445259
Publisher
The Institution of Engineering and Technology
Year
2007
Tongue
English
Weight
392 KB
Volume
1
Category
Article
ISSN
1751-8822

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