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Enhanced tunneling characteristics of PECVD silicon-rich-oxide (SRO) for the application in low voltage flash EEPROM
✍ Scribed by Lin, C.-J.; Hsu, C.C.-H.; Chen, H.-H.; Hong, G.; Lu, L.S.
- Book ID
- 114536627
- Publisher
- IEEE
- Year
- 1996
- Tongue
- English
- Weight
- 489 KB
- Volume
- 43
- Category
- Article
- ISSN
- 0018-9383
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