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Enhanced sensitivity and selectivity of a gas chromatography–microwave-induced plasma atomic emission system (GC-MIP) at the 685.6-nm fluorine emission line

✍ Scribed by Fabio Augusto; Antonio Luiz Pires Valente


Publisher
John Wiley and Sons
Year
1999
Tongue
English
Weight
103 KB
Volume
11
Category
Article
ISSN
1040-7685

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✦ Synopsis


As part of the studies for the characterization of a gas chromatography Ž . with microwave-induced plasma atomic emission detection GC-MIP prototype, its behavior at the 685.6-nm fluorine emission line was studied with isooctane solutions of n-perfluoroheptane and benzene. This test mixture was chromatographed under varied conditions of the plasma support helium flow rate and microwave Ž .

4 input power.

A relatively high value of 3.9 " 0.3 = 10 was found for the fluorine Ž . y1 to carbon selectivity, with detection limits for fluorine as low as 1.3 " 0.2 pg F и s . These levels for the selectivity and for the detection limit compare favorably with previous reports found in the literature for other GC-MIP systems.