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Enhanced parameter estimation methods for noisy SPECT data

โœ Scribed by Lingfeng Wen; Stefan Eberl; Hon-Chit Choi; David Dagan Feng; Michael Fulham


Book ID
113546483
Publisher
Elsevier Science
Year
2008
Tongue
English
Weight
346 KB
Volume
89
Category
Article
ISSN
0169-2607

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When experiments are conducted there is always a chance of the occurrence of large measurement errors (outliers). Common identification methods like generalized least squares, maximum likelihood etc. may not converge in these situations due to the presence of oufliers. Here we present a method for t