Enhanced on-wafer time-domain waveform measurement through removal of interconnect dispersion and measurement instrument jitter

✍ Scribed by Scott, J.B.; Verspecht, J.; Behnia, B.; Vanden Bossche, M.; Cognata, A.; Verbeyst, F.; Thorn, M.L.; Scherrer, D.R.

• Book ID: 114659722
• Publisher: IEEE
• Year: 2002
• Tongue: English
• Weight: 579 KB
• Volume: 50
• Category: Article
• ISSN: 0018-9480
• DOI: 10.1109/tmtt.2002.805169