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Enhanced gettering of iron impurities in bulk silicon by using external direct current electric field

✍ Scribed by W. P. Lee; E. P. Teh; H. K. Yow; C. L. Choong; T. Y. Tou


Book ID
107453393
Publisher
Springer US
Year
2005
Tongue
English
Weight
125 KB
Volume
34
Category
Article
ISSN
0361-5235

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