Enhanced dielectric properties in single crystal-like BiFeO[sub 3] thin films grown by flux-mediated epitaxy

✍ Scribed by Lim, S.-H.; Murakami, M.; Yang, J. H.; Young, S.-Y.; Hattrick-Simpers, J.; Wuttig, M.; Salamanca-Riba, L. G.; Takeuchi, I.

• Book ID: 121868985
• Publisher: American Institute of Physics
• Year: 2008
• Tongue: English
• Weight: 545 KB
• Volume: 92
• Category: Article
• ISSN: 0003-6951
• DOI: 10.1063/1.2831665