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Enhanced Breakdown Voltage With High Johnson's Figure-of-Merit in 0.3-$\mu{\rm m}$ T-gate AlGaN/GaN HEMTs on Silicon by $({\rm NH}_{4})_{2}{\rm S}_{x}$ Treatment

✍ Scribed by Arulkumaran, S.; Ng, G. I.; Vicknesh, S.


Book ID
121877210
Publisher
IEEE
Year
2013
Tongue
English
Weight
902 KB
Volume
34
Category
Article
ISSN
0741-3106

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