Engineering ethics

• Publisher: Elsevier Science
• Year: 2006
• Tongue: English
• Weight: 162 KB
• Volume: 9
• Category: Article
• ISSN: 1369-7021
• DOI: 10.1016/s1369-7021(06)71583-8

✦ Synopsis

Methods for examining structure at the microscopic scale have seen a number of recent developments. Many scanning probe microscopies have emerged, aberration correctors are revolutionizing traditional electron microscopy, and optical microscopy has seen the arrival of fluorescent, confocal, and two-photon variants. The contributions in this book each review a form of microscopy, describing the instruments and their areas of application.