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Energy threshold and ion yield for H− ions ejected from Si(1 1 1):H(1×1) during low energy electron collisions: study of ESD process in relation with atom manipulation in STM

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✍ Fumiya Shoji; Akihiko Yamada; Tatsuya Shiramizu; Kenjiro Oura 📂 Article 📅 1998 🏛 Elsevier Science 🌐 English ⚖ 203 KB

Energy threshold and ion yield for H− ions ejected from Si(1&#xa0;1&#xa0;1):H(1×1) during low energy electron collisions: study of ESD process in relation with atom manipulation in STM