Energy state distributions at oxide–semiconductor interfaces investigated by Laplace DLTS

✍ Scribed by L. Dobaczewski; V.P. Markevich; P. Kruszewski; I.D. Hawkins; A.R. Peaker

• Publisher: Elsevier Science
• Year: 2009
• Tongue: English
• Weight: 184 KB
• Volume: 404
• Category: Article
• ISSN: 0921-4526
• DOI: 10.1016/j.physb.2009.08.136