Energy dispersive X-ray spectroscopy analysis of YBa2Cu3−xSnxO7−δ superconductors fabricated by melt-texture-growth method

✍ Scribed by P.C.W. Fung; Z.L. Du; J.C.L. Chow; Z.H. He; T.F. Yu; Y.Y. Luo; Q.Y. Li; Y. Lu

• Publisher: Elsevier Science
• Year: 1993
• Tongue: English
• Weight: 984 KB
• Volume: 212
• Category: Article
• ISSN: 0921-4534
• DOI: 10.1016/0921-4534(93)90591-d

✦ Synopsis

Making use of the non-zero spatial temperature gradient at certain locations of a common tube furnace, we have fabricated bulk rectangular samples with nominal compositions YBazCu3_xSnxO7-a with highly oriented single crystal-like layers. The temperature range of 1028-930 °C is believed to be a crucial period during which single crystal-like layers are formed in the MTG process and our report is based on samples prepared with a cooling rate of 5 °C/h in the stated range. We have also carried out detailed energy dispersive X-ray spectroscopy analysis along a number of crystal layers, obtaining atomic percentages along these layers. With simple, plausible assumptions, we have found the phase amounts along the crystal layers. The process of analysis is repeated for the loose grains occurring in between the layers. Generally speaking, the amount of Y-123 present in the layers is around 50%-75%. The DC magnetization loops of these samples were also rn~asured ~ivin~ us very encouraging Jc values of about 3.0 × 104 A cm -z.