✦ LIBER ✦

Energy analyzed secondary ion mass spectroscopy and simultaneous Auger and XPS measurements of ion bombarded surfaces

✍ Scribed by A.R. Krauss; D.M. Gruen

No coin nor oath required. For personal study only.

📜 SIMILAR VOLUMES

A preliminary study of pure metal surfac

✍ M. Gettings; J.P. Coad 📂 Article 📅 1975 🏛 Elsevier Science 🌐 English ⚖ 739 KB

A comparison of secondary ion mass spect

✍ A.E. Morgan 📂 Article 📅 1983 🏛 Elsevier Science ⚖ 646 KB

An Auger electron spectroscopy-secondary

✍ Masao Yabumoto; Hiroshi Kakibayashi; Mamoru Mohri; Kuniaki Watanabe; Toshiro Yam 📂 Article 📅 1979 🏛 Elsevier Science 🌐 English ⚖ 299 KB

Measurements of relative secondary ion y

✍ A. Benninghoven; C. Plog; N. Treitz 📂 Article 📅 1974 🏛 Elsevier Science ⚖ 672 KB

Surface Analysis: An introduction to XPS

📂 Article 📅 1993 🏛 Elsevier Science 🌐 English ⚖ 54 KB

Measurement of ion energy distributions

✍ Walton, S. G.; Fernsler, R. F.; Leonhardt, D. 📂 Article 📅 2007 🏛 American Institute of Physics 🌐 English ⚖ 527 KB