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Empirical relations for the propagation characteristics of diffused channel waveguides

✍ Scribed by Barai, Samit ;Sharma, Anurag


Book ID
115353959
Publisher
The Optical Society
Year
2008
Tongue
English
Weight
813 KB
Volume
47
Category
Article
ISSN
1559-128X

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sion line by almost 2 ⍀ and 0.5᎐0.75 cmrns, respectively. Because the SiO layer has a significantly lower dielectric 2 constant than that of GaAs, its inclusion will result in a smaller capacitance per unit length of the CPS slow-wave electrodes. This results in an increase in the phase velocity of