Emotional arousal to negative information after traumatic experiences: an event-related brain potential study

✍ Scribed by D.T. Wei; J. Qiu; X. Du; Y.J. Luo

• Book ID: 116789481
• Publisher: Elsevier Science
• Year: 2011
• Tongue: English
• Weight: 820 KB
• Volume: 192
• Category: Article
• ISSN: 0306-4522
• DOI: 10.1016/j.neuroscience.2011.06.055