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Emitting layer thickness dependence of color stability in phosphorescent organic light-emitting devices

✍ Scribed by Chih-Hung Hsiao; Shun-Wei Liu; Chin-Ti Chen; Jiun-Haw Lee

Publisher
Elsevier Science
Year
2010
Tongue
English
Weight
585 KB
Volume
11
Category
Article
ISSN
1566-1199

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A comparative study of in situ post-growth annealing of organic layers before hole-blocking layer (HBL) or metal cathode deposition was conducted on tris-(phenyl-pyridyl)-iridium complex, Ir(ppy) 3 -based phosphorescent organic light-emitting devices (PHOLED). The devices were fabricated in the same