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Emissivity Measurements and Modeling of Silicon-Related Materials: An Overview

✍ Scribed by N. M. Ravindra; B. Sopori; O. H. Gokce; S. X. Cheng; A. Shenoy; L. Jin; S. Abedrabbo; W. Chen; Y. Zhang

Book ID: 110317149
Publisher: Springer
Year: 2001
Tongue: English
Weight: 655 KB
Volume: 22
Category: Article
ISSN: 0195-928X
DOI: 10.1023/a:1012869710173

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