EMIS Data Review Series No. 1 on: Properties of Amorphous Silicon No editor or author given Published by INSPEC Publication (Institution of Electrical Engineers) Price: £150
✍ Scribed by F.Z. Bathaei
- Book ID
- 104157631
- Publisher
- Elsevier Science
- Year
- 1988
- Tongue
- English
- Weight
- 69 KB
- Volume
- 19
- Category
- Article
- ISSN
- 0026-2692
No coin nor oath required. For personal study only.
✦ Synopsis
Amorphous silicon is a very interesting and useful electronic material. Until the mid-1970s research in this area was fairly limited. In 1976 the first doped samples of amorphous silicon were produced. Ever since, research in this field has taken a new turn as new devices and novel structures can be fabricated and studied.
Amorphous silicon research has many aspects ranging from the structural, electronic and optical properties of the material through to the closely related area of devices based on it. Furthermore, amorphous silicon is not a single material; its properties depend on and vary very strongly with the method of preparation. Even within a given preparation technique there is a great deal of variation depending on the exact deposition parameters. There are many academic and industrial research centres working on the various aspects of this material. It is therefore not surprising that the literature on the subject has grown at a prolific pace. It is very difficult for researchers in the field to keep up with the growing amount of information that is available. For a new researcher in the field it is almost impossible to scan the literature. This is where the EMIS Data Review Book on Properties of Amorphous Silicon can prove very useful. It provides the reader with a summary of nearly all the available information on amorphous silicon.
The book is divided into two main sections dealing with (a) the structure and (b) the electronic and optical properties of amorphous silicon. Each section is itself divided into several chapters concerned with specific aspects of the main theme. Every chapter contains several articles giving the results of various studies on amorphous silicon prepared by different techniques such as glow discharge, sputtering and chemical vapour deposition. In addition, properties of the most notable amorphous silicon alloys are also covered. Only the properties of the material itself are presented and there is no mention of developments in the field of devices based on this material.
Given the extent of research and literature available on this material no such book could be said to be complete. The EMIS Data Review Book, however, goes a very long way in including all the major developments and providing the reader with a general overview of the subject matter.
The articles on each topic are, of necessity, very short and simply state the available information without detail or explanation. Each article, however, contains numerous references dealing with the subject in greater detail.
The book is a valuable, if expensive, map guiding the researcher through the prolific maze of literature on amorphous silicon. It is of particular importance and value to new researchers in this rapidly growing area.