Emerging Nanotechnologies: Test, Defect Tolerance, and Reliability

✍ Scribed by T. Hogg, G. Snider (auth.), Mohammad Tehranipoor (eds.)

• Publisher: Springer US
• Year: 2008
• Tongue: English
• Leaves: 410
• Series: Frontiers in Electronic Testing 37
• Edition: 1
• Category: Library

✦ Synopsis

Emerging Nanotechnologies: Test, Defect Tolerance and Reliability covers various technologies that have been developing over the last decades such as chemically assembled electronic nanotechnology, Quantum-dot Cellular Automata (QCA), and nanowires and carbon nanotubes. Each of these technologies offers various advantages and disadvantages. Some suffer from high power, some work in very low temperatures and some others need indeterministic bottom-up assembly. These emerging technologies are not considered as a direct replacement for CMOS technology and may require a completely new architecture to achieve their functionality.

Emerging Nanotechnologies: Test, Defect Tolerance and Reliability brings all of these issues together in one place for readers and researchers who are interested in this rapidly changing field.

✦ Table of Contents

Front Matter....Pages IX-X
Front Matter....Pages 1-3
Defect-Tolerant Logic with Nanoscale Crossbar Circuits....Pages 5-32
Built-in Self-Test and Defect Tolerance in Molecular Electronics-Based Nanofabrics....Pages 33-61
Test and Defect Tolerance for Reconfigurable Nanoscale Devices....Pages 63-93
A Built-In Self-Test and Diagnosis Strategy for Chemically-Assembled Electronic Nanotechnology....Pages 95-120
Defect Tolerance in Crossbar Array Nano-Architectures....Pages 121-151
Front Matter....Pages 153-155
Reversible and Testable Circuits for Molecular QCA Design....Pages 157-202
Cellular Array-Based Delay-Insensitive Asynchronous Circuits Design and Test for Nanocomputing Systems....Pages 203-226
QCA Circuits for Robust Coplanar Crossing....Pages 227-249
Reliability and Defect Tolerance in Metallic Quantum-Dot Cellular Automata....Pages 251-263
Front Matter....Pages 265-265
Test Planning and Test Resource Optimization for Droplet-Based Microfluidic Systems....Pages 267-286
Testing and Diagnosis of Realistic Defects in Digital Microfluidic Biochips....Pages 287-312
Front Matter....Pages 313-314
Designing Nanoscale Logic Circuits Based on Principles of Markov Random Fields....Pages 315-338
Towards Nanoelectronics Processor Architectures....Pages 339-372
Design and Analysis of Fault-Tolerant Molecular Computing Systems....Pages 373-397
Back Matter....Pages 399-408

✦ Subjects

Circuits and Systems; Electronics and Microelectronics, Instrumentation; Nanotechnology; Quality Control, Reliability, Safety and Risk; Electrical Engineering