✦ LIBER ✦
EMC 2008 14th European Microscopy Congress 1–5 September 2008, Aachen, Germany || First results in thin film analysis based on a new EDS software to determine composition and/or thickness of thin layers on substrates
✍ Scribed by Luysberg, Martina; Tillmann, Karsten; Weirich, Thomas
- Book ID
- 120159719
- Publisher
- Springer Berlin Heidelberg
- Year
- 2008
- Weight
- 190 KB
- Category
- Article
- ISBN
- 3540851569
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