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EMC 2008 14th European Microscopy Congress 1–5 September 2008, Aachen, Germany || Application of 80kV Cs-corrected TEM for nanocarbon materials

✍ Scribed by Richter, Silvia; Schwedt, Alexander

No coin nor oath required. For personal study only.

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EMC 2008 14th European Microscopy Congre

✍ Richter, Silvia; Schwedt, Alexander 📂 Article 📅 2008 🏛 Springer Berlin Heidelberg ⚖ 440 KB

EMC 2008 14th European Microscopy Congre

✍ Luysberg, Martina; Tillmann, Karsten; Weirich, Thomas 📂 Article 📅 2008 🏛 Springer Berlin Heidelberg ⚖ 266 KB

EMC 2008 14th European Microscopy Congre

✍ Richter, Silvia; Schwedt, Alexander 📂 Article 📅 2008 🏛 Springer Berlin Heidelberg ⚖ 492 KB

EMC 2008 14th European Microscopy Congre

✍ Luysberg, Martina; Tillmann, Karsten; Weirich, Thomas 📂 Article 📅 2008 🏛 Springer Berlin Heidelberg ⚖ 251 KB

EMC 2008 14th European Microscopy Congre

✍ Luysberg, Martina; Tillmann, Karsten; Weirich, Thomas 📂 Article 📅 2008 🏛 Springer Berlin Heidelberg ⚖ 403 KB

EMC 2008 14th European Microscopy Congre

✍ Luysberg, Martina; Tillmann, Karsten; Weirich, Thomas 📂 Article 📅 2008 🏛 Springer Berlin Heidelberg ⚖ 389 KB