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EMC 2008 14th European Microscopy Congress 1–5 September 2008, Aachen, Germany || Aberration correction in SEM: Relaunching an old project

✍ Scribed by Luysberg, Martina; Tillmann, Karsten; Weirich, Thomas

Book ID
118172406
Publisher
Springer Berlin Heidelberg
Year
2008
Weight
207 KB
Category
Article
ISBN
3540851569

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Proceedings Of The14th European Microscopy Congress, Held In Aachen, Germany, 1-5 September 2008. Jointly Organised By The European Microscopy Society (ems), The German Society For Electron Microscopy (dge) And The Local Microscopists From Rwth Aachen University And The Research Centre Jülich, The C