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ELNES Si L-, K-edge and 0 K-edge spectroscopy as a tool for distinction of four- vs. six-coordinated silicon in high-pressure phases

✍ Scribed by F. Seifert, T. Sharp, B. Poe, Z. Wu


Book ID
118771634
Publisher
Springer-Verlag
Year
1996
Tongue
English
Weight
85 KB
Volume
23
Category
Article
ISSN
0342-1791

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