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Ellipsometry and adsorption: The determination of isotherms and the adsorbed layer thickness and fluctuations of the composition in the liquid-vapor interface

✍ Scribed by Mireille Privat; René Bennes; Emmanuel Tronel-Peyroz; Jean-Marc Douillard


Book ID
107787893
Publisher
Elsevier Science
Year
1988
Tongue
English
Weight
682 KB
Volume
121
Category
Article
ISSN
0021-9797

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