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Ellipsometry: a technique for real time monitoring and analysis of MBE-grown CdHgTe and CdTe/HgTe superlattices

✍ Scribed by R.H. Hartley; M.A. Folkard; D. Carr; P.J. Orders; D. Rees; I.K. Varga; V. Kumar; G. Shen; T.A. Steele; H. Buskes; J.B. Lee


Publisher
Elsevier Science
Year
1992
Tongue
English
Weight
413 KB
Volume
117
Category
Article
ISSN
0022-0248

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