✦ LIBER ✦

Ellipsometric study of semiconductor — Metal and metal — Metal oxide thin films system

✍ Scribed by B. Szücs; J. Ádám; P. Jakab

No coin nor oath required. For personal study only.

📜 SIMILAR VOLUMES

Ellipsometric analysis of mixed metal ox

✍ O. Buiu; W. Davey; Y. Lu; I.Z. Mitrovic; S. Hall 📂 Article 📅 2008 🏛 Elsevier Science 🌐 English ⚖ 298 KB

A UHV chamber for metal-semiconductor an

✍ C.A. Crider; J.M. Poate; J.E. Rowe; G.H. Wheatley 📂 Article 📅 1978 🏛 Elsevier Science ⚖ 634 KB

Noise in Thin Films Metal-Oxide-Metal Al

✍ G. Lecoy; L. Gouskov 📂 Article 📅 1968 🏛 John Wiley and Sons 🌐 English ⚖ 344 KB

Chiral Thin Films of Metal Oxide

✍ Moshe, Hagay; Vanbel, Maarten; Valev, Ventsislav Kolev; Verbiest, Thierry; Dress 📂 Article 📅 2013 🏛 John Wiley and Sons 🌐 English ⚖ 746 KB

Metal-insulator-semiconductor and metal-

✍ Larry J. Kepley; Debra D. Sackett; Christine M. Bell; Thomas E. Mallouk 📂 Article 📅 1992 🏛 Elsevier Science 🌐 English ⚖ 429 KB

Negative resistance characteristics of m

✍ Arya, S. P. S. ;Singh, H. P. 📂 Article 📅 1979 🏛 John Wiley and Sons 🌐 English ⚖ 106 KB