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Ellipsometric assessment of (Ga, Al) As/GaAs epitaxial layers during their growth in an organometallic VPE system

✍ Scribed by J.B. Theeten; F. Hottier; J. Hallais


Publisher
Elsevier Science
Year
1979
Tongue
English
Weight
613 KB
Volume
46
Category
Article
ISSN
0022-0248

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